Searching for just a few words should be enough to get started. If you need to make more complex queries, use the tips below to guide you.
Issue title: 26th International Workshop on Electromagnetic Nondestructive Evaluation
Guest editors: Theodoros Theodoulidis, Christophe Reboud and Christos Antonopoulos
Article type: Research Article
Authors: Wu, Tonga; | Wang, Yuanyuanb | Li, Xiaoguangc | Tao, Yua | Ye, Chaofenga;
Affiliations: [a] School of Information Science and Technology, ShanghaiTech University, Shanghai, China | [b] Yangjiang Nuclear Power Co., Ltd., Guangdong, China | [c] CGNPC Inspection Technology Co., Ltd., Suzhou, China
Correspondence: [*] Corresponding authors: Tong Wu, School of Information Science and Technology, ShanghaiTech University, Shanghai, 201210, China. E-mail: wutong2@shanghaitech.edu.cn. Chaofeng Ye, School of Information Science and Technology, ShanghaiTech University, Shanghai, 201210, China. E-mail: yechf@shanghaitech.edu.cn
Abstract: The reliability of thimble tubes plays a critical role for maintaining the safety of a nuclear power plant. The defect depth needs to be quantified and predicted to support the operational decision-making. This paper presents a method to quantify the defects on thimble tube wall based on the analyzation of eddy current testing (ECT) data. Then, a method using artificial neural network (ANN) to predict the detect depth is studied. The tubes are divided into 2 shapes and four regions according to their positions and the data of each region and each shape is expanded by mean interpolation. A prediction model based on ANN is constructed for each shape in each region. The experimental results show that the model can predict the signal of the next year according to the signal of the previous three years with mean absolute percentage error less than 16%.
Keywords: Thimble tube, eddy current testing, artificial neural network, quantification, prediction
DOI: 10.3233/JAE-230132
Journal: International Journal of Applied Electromagnetics and Mechanics, vol. 74, no. 4, pp. 327-334, 2024
IOS Press, Inc.
6751 Tepper Drive
Clifton, VA 20124
USA
Tel: +1 703 830 6300
Fax: +1 703 830 2300
sales@iospress.com
For editorial issues, like the status of your submitted paper or proposals, write to editorial@iospress.nl
IOS Press
Nieuwe Hemweg 6B
1013 BG Amsterdam
The Netherlands
Tel: +31 20 688 3355
Fax: +31 20 687 0091
info@iospress.nl
For editorial issues, permissions, book requests, submissions and proceedings, contact the Amsterdam office info@iospress.nl
Inspirees International (China Office)
Ciyunsi Beili 207(CapitaLand), Bld 1, 7-901
100025, Beijing
China
Free service line: 400 661 8717
Fax: +86 10 8446 7947
china@iospress.cn
For editorial issues, like the status of your submitted paper or proposals, write to editorial@iospress.nl
如果您在出版方面需要帮助或有任何建, 件至: editorial@iospress.nl