Affiliations: [a] Dipartimento di Ingegneria Industriale e dell’Informazione, Università di Pavia, I-27100 Pavia, Italy | [b] Dipartimento di Ingegneria Industriale e dell’Informazione, Università degli Studi della Campania “Luigi Vanvitelli”, I-81031 Aversa (CE), Italy | [c] Dipartimento Energia, Politecnico di Torino, I10129 Torino, Italy | [d] Dipartimento di Ingegneria, Università Roma Tre, I-00146 Roma, Italy
Correspondence:
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Corresponding author: Alessandro Formisano, Dipartimento di Ingegneria Industriale e dell’Informazione, Università degli Studi della Campania “Luigi Vanvitelli”, Via Roma 29, I-81031 Aversa (CE), Italy. Tel.: +39 081 5010342; Fax: +39 081 5037042; E-mail: Alessandro.Formisano@unicampania.it.
Abstract: To counteract the performance degradation in electromagnetic devices due to mechanical tolerances, assembly inaccuracies, poor knowledge of material parameters, etc., many robust design techniques have been proposed. A first class of methods takes advantage from statistical analysis to improve the average performance taking into account actual, randomly distributed values rather than the nominal figure of the parameters design values. A second class, making use of the “sensitivity” of device performance with respect to different parameters, looks for solutions as insensitive as possible with respect to possible modifications of the design parameters. In this paper, with the aim of presenting a synthetic selection of existing methods, a brief survey of the different approaches is presented. A simple test case is considered for demonstration purposes.
