Searching for just a few words should be enough to get started. If you need to make more complex queries, use the tips below to guide you.
Issue title: 20th International Symposium on Applied Electromagnetics and Mechanics
Guest editors: Theodoros Theodoulidis, Christos Antonopoulos, Nikolaos Kantartzis, Ioannis Rekanos and Theodoros Zygiridis
Article type: Research Article
Authors: Song, Haichenga | Yusa, Noritakaa;
Affiliations: [a] Department of Quantum Science and Energy Engineering, Graduate School of Engineering, Tohoku University, Sendai, Miyagi, Japan
Correspondence: [*] Corresponding author: Noritaka Yusa, Department of Quantum Science and Energy Engineering, Graduate School of Engineering, Tohoku University, Sendai, Miyagi, Japan. E-mail: noritaka.yusa.d5@tohoku.ac.jp
Abstract: In this study, a multivariable probability of detection (POD) model is developed to quantify the detection capability of a low frequency electromagnetic (LFEM) testing method with permanently installed sensors to monitor the thinning of pipe walls. Numerical simulations are utilized to predict the signal response by modeling LFEM testing against local wall thinning with different profiles. By probabilistically calibrating the simulated signal response with a limited number of experimental samples, signal response distributions due to various flaw profiles are inferred. Subsequently, a model is developed using Monte Carlo simulation to determine the distribution of the signal response affected by sensor placement and to calculate the POD. The resultant POD contours reflect the effect of multiple flaw parameters and sensor placement on the detection capability of the LFEM testing method.
Keywords: Electromagnetic non-destructive evaluation, probability of detection, sensor network
DOI: 10.3233/JAE-220100
Journal: International Journal of Applied Electromagnetics and Mechanics, vol. 71, no. S1, pp. S29-S37, 2023
IOS Press, Inc.
6751 Tepper Drive
Clifton, VA 20124
USA
Tel: +1 703 830 6300
Fax: +1 703 830 2300
sales@iospress.com
For editorial issues, like the status of your submitted paper or proposals, write to editorial@iospress.nl
IOS Press
Nieuwe Hemweg 6B
1013 BG Amsterdam
The Netherlands
Tel: +31 20 688 3355
Fax: +31 20 687 0091
info@iospress.nl
For editorial issues, permissions, book requests, submissions and proceedings, contact the Amsterdam office info@iospress.nl
Inspirees International (China Office)
Ciyunsi Beili 207(CapitaLand), Bld 1, 7-901
100025, Beijing
China
Free service line: 400 661 8717
Fax: +86 10 8446 7947
china@iospress.cn
For editorial issues, like the status of your submitted paper or proposals, write to editorial@iospress.nl
如果您在出版方面需要帮助或有任何建, 件至: editorial@iospress.nl