Searching for just a few words should be enough to get started. If you need to make more complex queries, use the tips below to guide you.
Article type: Research Article
Authors: Zhou, Deqianga; b; c; | Jiao, Tianqia | Gao, Xued | Zhou, Runtaoa | Sheng, Weifenga
Affiliations: [a] School of Mechanical Engineering, Jiangnan University, Wuxi, China | [b] The Key Laboratory for Advanced Food Manufacturing Equipment Technology of Jiangsu Province, Wuxi, China | [c] Key Laboratory of Nondestructive Testing (Nanchang Hangkong University), Ministry of Education, Nanchang, China | [d] School of Intelligent Control, Changzhou Vocational Institute of Industry Technology, Changzhou, China
Correspondence: [*] Corresponding author: Deqiang Zhou, School of Mechanical Engineering, Jiangnan University, Wuxi, 214122, China. E-mail: zhoudeqiang@jiangnan.edu.cn
Abstract: Since Remote field eddy current (RFEC) detection technology is barely limited by the skin effect, it can realize the defect detection of large-thickness components. Whereas, the structure of the RFEC probe for the planar conductor is complicated, resulting in an oversized probe. This hinders the application and development of the RFEC testing technology. In this paper, finite element simulations and experimental verification are used to optimize the RFEC probe structure for flat conductors. The results have shown that the thickness of the magnetic shield is the dominant factor in achieving high performance of RFEC inspection of flat conductors. When inspecting both ferromagnetic and non-ferromagnetic flat conductors, cylindrical magnetic shields with appropriate thickness and appropriate excitation frequencies are preferred for improvement of RFEC testing.
Keywords: Magnetic shielding, RFEC, energy flow analysis, nondestructive testing
DOI: 10.3233/JAE-220089
Journal: International Journal of Applied Electromagnetics and Mechanics, vol. 71, no. 4, pp. 325-339, 2023
IOS Press, Inc.
6751 Tepper Drive
Clifton, VA 20124
USA
Tel: +1 703 830 6300
Fax: +1 703 830 2300
sales@iospress.com
For editorial issues, like the status of your submitted paper or proposals, write to editorial@iospress.nl
IOS Press
Nieuwe Hemweg 6B
1013 BG Amsterdam
The Netherlands
Tel: +31 20 688 3355
Fax: +31 20 687 0091
info@iospress.nl
For editorial issues, permissions, book requests, submissions and proceedings, contact the Amsterdam office info@iospress.nl
Inspirees International (China Office)
Ciyunsi Beili 207(CapitaLand), Bld 1, 7-901
100025, Beijing
China
Free service line: 400 661 8717
Fax: +86 10 8446 7947
china@iospress.cn
For editorial issues, like the status of your submitted paper or proposals, write to editorial@iospress.nl
如果您在出版方面需要帮助或有任何建, 件至: editorial@iospress.nl