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Issue title: Proceedings from the 17th International Symposium on Applied Electromagnetics and Mechanics (ISEM 2015)
Guest editors: Fumio Kojima, Futoshi Kobayashi and Hiroyuki Nakamoto
Article type: Research Article
Authors: Zhang, Wenguang* | Ma, Yakun | Li, Zhengwei
Affiliations: State Key Laboratory of Mechanical System and Vibration, Shanghai Jiao Tong University, Shanghai, China
Correspondence: [*] Corresponding author: Wenguang Zhang, State Key Laboratory of Mechanical System and Vibration, Shanghai Jiao Tong University, Shanghai 200240, China. Tel.: +86 21 34204851; E-mail:zhwg@sjtu.edu.cn
Abstract: During the process that neural probes are implanted, the insertion will cause acute injury of brain tissue and then trigger reactive responses, which may lead to degradation of the recording signals. In this paper, the process of neural probe's insertion into brain was simulated by developing a nonlinear finite element model. An element deletion method based on maximum shear stress criterion was utilized as the failure mechanism of brain tissue. It was found that as the wedge angle of the probe increases, the injury of brain tissue becomes larger. Besides, faster insertion speed leads to less tissue injury. The probe stiffness, however, gives a negligible effect on tissue injury. The results are helpful to minimize the insertion trauma based on optimal design of insertion parameters and neural probe physical characteristics.
Keywords: Neural probe, insertion process, finite element
DOI: 10.3233/JAE-162177
Journal: International Journal of Applied Electromagnetics and Mechanics, vol. 52, no. 3-4, pp. 1061-1067, 2016
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