Searching for just a few words should be enough to get started. If you need to make more complex queries, use the tips below to guide you.
Issue title: Proceedings from the 17th International Symposium on Applied Electromagnetics and Mechanics (ISEM 2015)
Guest editors: Fumio Kojima, Futoshi Kobayashi and Hiroyuki Nakamoto
Article type: Research Article
Authors: Yang, Yun | Li, Long | Feng, Bo | Kang, Yihua*
Affiliations: School of Mechanical Science and Engineering, Huazhong University of Science and Technology, Wuhan, Hubei, China
Correspondence: [*] Corresponding author: Yihua Kang, School of Mechanical Science and Engineering, Huazhong University of Science and Technology, 1037 Luoyu Road, Wuhan 430074, Hubei, China. E-mail:yihuakang@mail.hust.edu.cn
Abstract: The micro-crack is always difficult to discover in the widely applied magnetic flux leakage (MFL) inspection because of the weak leakage magnetic field. Hence, a novel method for enhancing the micro-crack signal based on the magnetic particle adsorption is proposed. The mechanism of magnetic field distribution in the vicinity of the micro-crack based on the new method is analyzed from the angle of magnetic refraction. The confirmation for the signal enhancement and further discussion are presented with the finite element simulation. Simulation results indicate that the signal of the micro-crack is significantly enhanced based on the magnetic particle adsorption which confirms the feasibility of the novel method. In addition, the ability of the signal enhancement is more relevant to the maximum height than the maximum width of the magnetic particle indication, and the signal increases when the relative permeability of the gathered magnetic particles is bigger.
Keywords: Magnetic flux leakage (MFL) inspection, magnetic particle testing (MT), micro-crack, signal enhancement
DOI: 10.3233/JAE-162165
Journal: International Journal of Applied Electromagnetics and Mechanics, vol. 52, no. 3-4, pp. 1107-1113, 2016
IOS Press, Inc.
6751 Tepper Drive
Clifton, VA 20124
USA
Tel: +1 703 830 6300
Fax: +1 703 830 2300
sales@iospress.com
For editorial issues, like the status of your submitted paper or proposals, write to editorial@iospress.nl
IOS Press
Nieuwe Hemweg 6B
1013 BG Amsterdam
The Netherlands
Tel: +31 20 688 3355
Fax: +31 20 687 0091
info@iospress.nl
For editorial issues, permissions, book requests, submissions and proceedings, contact the Amsterdam office info@iospress.nl
Inspirees International (China Office)
Ciyunsi Beili 207(CapitaLand), Bld 1, 7-901
100025, Beijing
China
Free service line: 400 661 8717
Fax: +86 10 8446 7947
china@iospress.cn
For editorial issues, like the status of your submitted paper or proposals, write to editorial@iospress.nl
如果您在出版方面需要帮助或有任何建, 件至: editorial@iospress.nl