Searching for just a few words should be enough to get started. If you need to make more complex queries, use the tips below to guide you.
Issue title: Proceedings from the 17th International Symposium on Applied Electromagnetics and Mechanics (ISEM 2015)
Guest editors: Fumio Kojima, Futoshi Kobayashi and Hiroyuki Nakamoto
Article type: Research Article
Authors: Liu, Haochen | Xie, Shejuan | Pei, Cuixiang | Chen, Zhenmao*
Affiliations: Shaanxi Engineering Research Center for NDT and Structural Integrity Evaluation, State Key Laboratory for Strength and Vibration of Mechanical Structures, Xi'an Jiaotong University, Xi'an, Shaanxi, China
Correspondence: [*] Corresponding author: Zhenmao Chen, School of Aerospace, Xi'an Jiaotong University, 28 West Xianning Road, Xi'an 710049, Shaanxi, China. Tel./Fax: +86 29 8266 8736; E-mail:chenzm@mail.xjtu.edu.cn
Abstract: In this paper, a new efficient numerical method based on the finite element method (FEM) and the frequency domain summation (FDS) strategy is proposed for the simulation of the pulsed infrared thermography non-destructive testing. With use of the FDS strategy, the temperature distribution due to a pulsed thermal source is simulated based on the thermal response of series of single-frequency sinusoidal heat sources. An interpolation strategy is also adopted to reduce the necessary number of harmonic frequency responses to be calculated, and consequently the simulation time is saved. A comparison of the FDS strategy and the direct time domain integration method is also presented, which indicates that the FDS strategy can simulate pulsed thermography problem with high precision and can promote simulation efficiency.
Keywords: Numerical simulation, pulse thermography, frequency domain method, NDT
DOI: 10.3233/JAE-162121
Journal: International Journal of Applied Electromagnetics and Mechanics, vol. 52, no. 1-2, pp. 381-389, 2016
IOS Press, Inc.
6751 Tepper Drive
Clifton, VA 20124
USA
Tel: +1 703 830 6300
Fax: +1 703 830 2300
sales@iospress.com
For editorial issues, like the status of your submitted paper or proposals, write to editorial@iospress.nl
IOS Press
Nieuwe Hemweg 6B
1013 BG Amsterdam
The Netherlands
Tel: +31 20 688 3355
Fax: +31 20 687 0091
info@iospress.nl
For editorial issues, permissions, book requests, submissions and proceedings, contact the Amsterdam office info@iospress.nl
Inspirees International (China Office)
Ciyunsi Beili 207(CapitaLand), Bld 1, 7-901
100025, Beijing
China
Free service line: 400 661 8717
Fax: +86 10 8446 7947
china@iospress.cn
For editorial issues, like the status of your submitted paper or proposals, write to editorial@iospress.nl
如果您在出版方面需要帮助或有任何建, 件至: editorial@iospress.nl