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Article type: Research Article
Authors: de Souza, Ivan Alvesa; | de Medeiros Neto, Joao Freirea | Nascimento, Igor Oliveiraa | Matamoros, Efrain Pantaleona | Feitor, Michelle Cequeiraa | Fernandes, Fernanda de Meloc | Magalhães Sousa, Rômulo Ribeirob | de Carvalho Costa, Thércio Henriquea
Affiliations: [a] Labplasma, Federal University of Rio Grande do Norte, Natal, RN, Brazil | [b] Federal University of Piauí, Teresina, PI, Brazil | [c] University of Campinas, Campinas, SP, Brazil
Correspondence: [*] Corresponding author: Ivan Alves de Souza, Federal University of Rio Grande do Norte -- Labplasma- UFRN, Natal, RN, Brazil. E-mail: ivanalves@ufrn.edu.br
Abstract: This work aimed to characterize a Dielectric Barrier Discharge (DBD) plasma equipment through optical and electrical measurements, seeking to obtain a greater knowledge of the plasma production process and how it behaves through the adopted parameters, such as frequency and voltage applied between electrodes, at a fixed distance of 1.7 mm. In order to measure them, three different characterization techniques were applied. The first method was the Lissajous figures, a technique quite effective for a complete electrical characterization of DBD equipment. The second technique used was the Optical Emission Spectroscopy, a tool used for the diagnosis of plasma, being it possible to identify the excited species produced in discharge in diffuse and filamentary regime in the plasma. And finally, the triple Langmuir probe technique was used to obtain the electron temperature and electron density. Based on this study, it was possible to identify the equipment efficiency in different regimes. The electron temperature measurement for both systems analyzed were 27.96 eV and 20.69 eV to the filamentary and diffuse regimes, respectively. The density of electrons number to these regimes were 1.09 × 1021 m−3 and 1.56 × 1021 m−3.
Keywords: Lissajous figures, electron temperature, electron density, triple Langmuir probe
DOI: 10.3233/JAE-190044
Journal: International Journal of Applied Electromagnetics and Mechanics, vol. 63, no. 2, pp. 315-325, 2020
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