Affiliations: [a] National Key Laboratory on Electromagnetic Environment
and Electro-Optical Engineering, PLA University of Science and Technology,
Nanjing, Jiangsu, China
Correspondence:
[*]
Corresponding author: Run Xiong, National Key laboratory on
Electromagnetic Environment and Electro-Optical Engineering, PLA University of
Science and Technology, Nanjing 210007, Jiangsu, China. Tel.: +86 258 407 7386;
E-mail: xiongrun1983@hotmail.com
Abstract: A numerically efficient method for the finite-difference time-domain
(FDTD) analysis of shielding effectiveness (SE) of large shielding enclosures
has been proposed in this paper. FDTD has been widely applied in the SE
analysis, but it is difficult to analyze the SE using the standard FDTD method
when large shielding enclosures with thin-slots are involved. To model the
narrow apertures without involving too much memory occupation, the thin-slot
formalism is adopted. The parallel implementation is induced into the
simulation in order to overcome the limitation of a single processor's memory.
To decrease the simulating time, windowing technique is used in the SE
analysis. By using these artifices, the FDTD analysis of large shielding
enclosures can be carried out efficiently.
