Searching for just a few words should be enough to get started. If you need to make more complex queries, use the tips below to guide you.
Issue title: Selected Papers from the 15th International Symposium on Applied Electromagnetics and Mechanics (ISEM 2011)
Article type: Research Article
Authors: Cherry, Matthewa; * | Knopp, Jeremyb | Blodgett, Markb | Grandhi, Ramanac
Affiliations: [a] Structural Integrity Division, University of Dayton Research Institute, Dayton, OH, USA | [b] NDE Branch, Air Force Research Labs, Dayton, OH, USA | [c] ME Department, Wright State University, Dayton, OH, USA
Correspondence: [*] Corresponding author: Matthew Cherry, Structural Integrity Division, University of Dayton Research Institute, 300 College Park, Dayton Ohio, 45469, OH, USA. Tel.: +1 937 255 1605; Fax: +1 937 255 9804; E-mail: matthew.cherry.ctr@wpafb.af.mil
Abstract: Eddy current detection of flaws in edges presents challenges in experimental procedures during benchmark studies in the laboratory for model validation as well as practical implementation of a real world detection system. These difficulties result in distortions to the signal that mask the effects from the flawed region itself. Rather than attempting to perfect the experimental setup, we propose to make the numerical models more robust by incorporating randomness in the experimental procedure with uncertainty quantification methods. We present the motivation for the specific method chosen, the probabilistic collocation method (PCM), and the mathematical development behind the method, and then present the results from numerical simulations with a validation measure.
Keywords: Probabilistic, collocation, eddy, current
DOI: 10.3233/JAE-2012-1472
Journal: International Journal of Applied Electromagnetics and Mechanics, vol. 39, no. 1-4, pp. 283-289, 2012
IOS Press, Inc.
6751 Tepper Drive
Clifton, VA 20124
USA
Tel: +1 703 830 6300
Fax: +1 703 830 2300
sales@iospress.com
For editorial issues, like the status of your submitted paper or proposals, write to editorial@iospress.nl
IOS Press
Nieuwe Hemweg 6B
1013 BG Amsterdam
The Netherlands
Tel: +31 20 688 3355
Fax: +31 20 687 0091
info@iospress.nl
For editorial issues, permissions, book requests, submissions and proceedings, contact the Amsterdam office info@iospress.nl
Inspirees International (China Office)
Ciyunsi Beili 207(CapitaLand), Bld 1, 7-901
100025, Beijing
China
Free service line: 400 661 8717
Fax: +86 10 8446 7947
china@iospress.cn
For editorial issues, like the status of your submitted paper or proposals, write to editorial@iospress.nl
如果您在出版方面需要帮助或有任何建, 件至: editorial@iospress.nl