Modelling of a thin crack in ECT using a-ψ formulation with Whitney elements

Issue title: Proceedings of the twelfth International Symposium on Interdisciplinary Electromagnetic, Mechanic and Biomedical Problems, ISEM Bad Gastein

Article type: Research Article

Authors: Choua, Yahya^a | Santandrea, Laurent^a | Bihan, Yann Le^{a; *} | Marchand, Claude^a

Affiliations: [a] LGEP/SPEE Labs; CNRS UMR8507; Supelec; Univ Pierre et Marie Curie-P6; Univ Paris Sud-P11; 91192 Gif-sur-Yvette Cedex, France

Correspondence: [*] Corresponding author. Tel.: +33 1 69 85 16 61; Fax: +33 1 69 41 83 18; E-mail: yann.le-bihan@lgep.supelec.fr

Abstract: A finite element modelling of thin cracks in eddy current testing (ECT) is proposed using an a-ψ formulation with edge and nodal Whitney element discretization. A double layer of nodes is employed on the surface of the crack in order to comply with the right behaviour of the electromagnetic fields. The benchmark problem team workshop n° 15-1 has been solved and the computation results have been compared to the experimental ones.

Keywords: Eddy current testing, finite element method, thin cracks

DOI: 10.3233/JAE-2007-796

Journal: International Journal of Applied Electromagnetics and Mechanics, vol. 25, no. 1-4, pp. 185-188, 2007