Visualization of back surface defects by piezoelectric film

Issue title: Proceedings of the tenth International Symposium on Applied Electromagnetics and Mechanics ISEM-Tokyo

Article type: Research Article

Authors: Komagome, Yuji^a | Matsumoto, Eiji^{a; *}

Affiliations: [a] Department of Energy Conversion Science, Kyoto University, Yoshida-Honmachi, Sakyou-Ku, Kyoto, 606-8501, Japan

Correspondence: [*] Corresponding author: Eiji Matsumoto, Tel./Fax: +81 75 753 5247; E-mail: matumoto@energy.kyoto-u.ac.jp

Abstract: The surface strain distribution of a plate can be measured from the electric potential on the piezoelectric film mounted on it. When the plate with a back surface defect is deformed, the resultant strain distribution on the front surface reflects the size and the shape of the defect. Instead of measuring the electric potential by the electrostatic voltmeter, this paper attempts to visualize the strain distribution by means of absorption of charged polymer powder to the piezoelectric film. And also attempting this method to the various size of the defect, resolution of detecting the defects is discussed by the experiment.

DOI: 10.3233/JAE-2002-418

Journal: International Journal of Applied Electromagnetics and Mechanics, vol. 14, no. 1-4, pp. 425-428, 2002