Diagnostics of sub-picosecond electron pulse using the fluctuation method

Issue title: Proceedings of the tenth International Symposium on Applied Electromagnetics and Mechanics ISEM-Tokyo

Article type: Research Article

Authors: Nakamura, Kei^{a; *} | Watanabe, Takahiro^a | Ueda, Toru^a | Yoshii, Koji^a | Uesaka, Mitsuru^a

Affiliations: [a] Nuclear Engineering Research Laboratory, University of Tokyo, 22-2 Shirakata-Shirane, Tokai, Naka, Ibaraki 319-1188, Japan

Correspondence: [*] Corresponding author: Kei Nakamura, Tel.: +81 29 287 8970; Fax: +81 29 287 8471; E-mail: kee@tokai.t.u-tokyo.ac.jp

Abstract: Numerical analysis and measurement of longitudinal bunch length of subpico- and picosecond electron beams by the fluctuation method has been carried out at the S-band twin linear accelerators at Nuclear Engineering Research Laboratory (NERL), University of Tokyo. The diagnostics method utilizes a statistical analysis of shot-noise-driven fluctuations in incoherent radiation. Measurements were performed on Cherenkov radiation emitted by ∼ 1.0 ps (FWHM), 20 MeV electron bunch. As a result, the fluctuation method indicated 5 times longer than that by the streak camera. The discrepancy was caused by neglecting the influence of the transverse emittance. Then, the influence of the transverse profile upon the measurement was analyzed and discussed.

DOI: 10.3233/JAE-2002-387

Journal: International Journal of Applied Electromagnetics and Mechanics, vol. 14, no. 1-4, pp. 203-208, 2002