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RETRACTED: An improved software defect prediction model based on grey incidence analysis and Naive Bayes algorithm

Article type: Research Article

Authors: Zhang, Shu | Wang, Yuhong; *

Affiliations: School of Business, Jiangnan University, Wuxi, Jiangsu Province, China

Correspondence: [*] Corresponding author. Yuhong Wang, School of Business, Jiangnan University, Wuxi, Jiangsu Province 214122, China. E-mail: yuhongwang@jiangnan.edu.cn.

Abstract: This article has been retracted. A retraction notice can be found at https://doi.org/10.3233/JIFS-219433.

DOI: 10.3233/JIFS-213570

Journal: Journal of Intelligent & Fuzzy Systems, vol. 43, no. 5, pp. 6047-6060, 2022

Published: 22 September 2022
Price: EUR 27.50
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