A Uniform Test Approach for RCC-Adders¹

Article type: Research Article

Authors: Becker, Bernd^a | Sparmann, Uwe^b

Affiliations: [a] Fachbereich 20, J.W. von Goethe Universität, D-6000 Frankfurt/Main, Germany | [b] Fachbereich 14, Universität des Saarlandes, D-6000 Saarbriicken, Germany

Note: [1] This work was supported by Deutsche Forschungsgemeinschaft under contract SFB 124 B1, VLSI Entwurfsmethoden und Parallelität, and by BMFT Grant 413-5839-ITS8501A7, Kooperationsprojekt TESUS der Firmen Nixdorf und Siemens. A short version of this paper appeared in the Proceedings of AWOC88 [7].

Abstract: In this paper testability aspects of Recursive Carry Computation adders are considered. The class of RCC-adders has been introduced in [5] and contains a wide range of different adder realizations (e.g., optimal time adders such as the the carry look-ahead adder of [8] and the conditional carry adder of [5]). We show that symbolic computation can be used to define this class and at the same time offers a uniform test approach which can be applied at an early stage of the design process. The class of RCC-adders itself splits into several subclasses which are specified by structural properties of the overall computation scheme and functional properties of the basic cells. Optimal complete test sets with respect to two commonly used fault models, the single stuck-at fault model and the single cellular fault model, are developed for these RCC-subclasses. The cardinality of the test sets depends on the choice of the fault model and on structural properties of the RCC-subclass. To summarize our results, we finally obtain tables with upper and lower bounds characterizing the test complexity of classes of RCC-adders. The upper bounds are obtained by the effective construction of complete test sets. The cardinality of these sets varies between a logarithmic or linear number of patterns for an n-bit RCC-adder.

DOI: 10.3233/FI-1991-14203

Journal: Fundamenta Informaticae, vol. 14, no. 2, pp. 185-219, 1991