Searching for just a few words should be enough to get started. If you need to make more complex queries, use the tips below to guide you.
Article type: Research Article
Authors: Yoon, Kee Bong | Park, Tae Gyu | Saxena, Ashok;
Affiliations: Department of Mechanical Engineering, Chung Ang University, Seoul, Korea | College of Engineering, 4183 Bell Engineering Center, University of Arkansas, Fayetteville, AR 72701, USA
Note: [] Corresponding author: Prof. Ashok Saxena, College of Engineering, 4183 Bell Engineering Center, University of Arkansas, Fayetteville, AR 72701, USA. Tel.: +1 479 575 3054; Fax: +1 479 575 4346; E-mail: asaxena@engr.uark.edu.
Abstract: The removal of grain boundaries normal to the principal loading direction with the introduction of directionally solidified (DS) grains has significantly improved creep strength, resistance to thermal fatigue, crack growth and oxidation. In this study, a model is developed for representing and predicting the high temperature fatigue crack growth behavior of directionally solidified Ni base alloy, DS GTD-111. A new physically-based model is proposed that accurately represents the influence of temperature on the fatigue crack growth behavior. The test material was cast in the form of slabs that were approximately 254 mm long, 197 mm wide and 32 mm thick. Fatigue crack growth tests were carried out using 50.8 mm wide compact type specimens at 24, 649, 760 and 871°C in LT and TL orientations. The results showed that the dependence of the fatigue crack growth exponent, m, on the test temperature as well as the specimen orientation was weak. Hence, m was considered as constant in the temperature ranges considered in this study for both specimen orientations. The fatigue crack growth coefficient, c, was seen to increase with increasing temperature. A model based on thermal activation of dislocations is developed and shown to represent all the data.
Keywords: Creep, Ni base alloys, fatigue, crack, elevated temperature
Journal: Strength, Fracture and Complexity, vol. 4, no. 1, pp. 35-40, 2006
IOS Press, Inc.
6751 Tepper Drive
Clifton, VA 20124
USA
Tel: +1 703 830 6300
Fax: +1 703 830 2300
sales@iospress.com
For editorial issues, like the status of your submitted paper or proposals, write to editorial@iospress.nl
IOS Press
Nieuwe Hemweg 6B
1013 BG Amsterdam
The Netherlands
Tel: +31 20 688 3355
Fax: +31 20 687 0091
info@iospress.nl
For editorial issues, permissions, book requests, submissions and proceedings, contact the Amsterdam office info@iospress.nl
Inspirees International (China Office)
Ciyunsi Beili 207(CapitaLand), Bld 1, 7-901
100025, Beijing
China
Free service line: 400 661 8717
Fax: +86 10 8446 7947
china@iospress.cn
For editorial issues, like the status of your submitted paper or proposals, write to editorial@iospress.nl
如果您在出版方面需要帮助或有任何建, 件至: editorial@iospress.nl