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Article type: Research Article
Authors: Yu. Karabekov, A. | Kozhevnikov, I. V. | Fedyukovich, V. E.
Affiliations: P. N. Lebedev Physics Institute, Academy of Sciences, Leninskii prospect 55, Moscow, Russia
Abstract: Destructive interference of waves scattered from both interfaces of a thin film deposited onto a rough substrate is theoretically shown to lead to considerable suppression (up to some orders) of x-ray scattering intensity. The conditions that are necessary for the suppression of scattering are discussed.
DOI: 10.3233/XST-1993-4104
Journal: Journal of X-Ray Science and Technology, vol. 4, no. 1, pp. 37-43, 1993
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