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Article type: Research Article
Authors: Gul, Attiaa | Farrukh, Salmanb | Kakakhel, M. Basima; * | Ilyas, Nasirc | Naveed, Muhammadb | Haseeb, Abdulb | Mirza, Sikander M.a
Affiliations: [a] Department of Physics & Applied Mathematics, Pakistan Institute of Engineering and Applied Sciences (PIEAS), Islamabad, Pakistan | [b] Atomic Energy Medical Centre (AEMC), Jinnah Postgraduate Medical Centre (JPMC), Karachi, Pakistan | [c] Institution of Space and Planetary Astrophysics (ISPA), University of Karachi, Karachi, Pakistan
Correspondence: [*] Corresponding author: M. Basim Kakakhel, Department of Physics & Applied Mathematics, Pakistan Institute of Engineering and Applied Sciences (PIEAS), Islamabad 45650, Pakistan. Tel.: +92 51 111174327/Ext. 3020; Fax: +92 51 9248600; E-mail: basim@pieas.edu.pk.
Abstract: The objective of this study is to analyze small field photon beams acquired with commonly available detectors. Beam profiles of 6 MV photons from the Siemens Primus Linear Accelerator were measured with a micro ion chamber (IC CC01, IBA) and linear diode array (LDA-99SC, IBA). Data was acquired using a water phantom for small fields (0.5×0.5 cm2 to 4×4 cm2) at depth of maximum dose, 5 cm and 10 cm. Profiles were also generated with EGSnrc Monte Carlo code. Measured and simulated profiles were compared in terms of percentage difference of the area under the simulated and measured profiles (PD), ratio of the measured to simulated dose at the point of maximum deviation within the central region of profile (R), full width half maximum (FWHM) and penumbra. For field sizes ≥1×1 cm2, the maximum PD is 3.17 % and 2.87 % for IC and LDA respectively, whereas R is in the range of 0.95–1.05 for IC and 0.99–1.05 for LDA. LDA measured FWHM and penumbra are also in better agreement with the simulated results. This study demonstrated that LDA can be used for acquisition of beam profiles for field size as low as 1×1 cm2.
Keywords: Small field, dosimetry, beam profiles, monte carlo, 6 MV X-ray
DOI: 10.3233/XST-190493
Journal: Journal of X-Ray Science and Technology, vol. 27, no. 4, pp. 655-664, 2019
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