Searching for just a few words should be enough to get started. If you need to make more complex queries, use the tips below to guide you.
Article type: Research Article
Authors: Ghanbari, K. | Ghoranneviss, M. | Elahi, A. Salar | Saviz, S.
Affiliations: Plasma Physics Research Center, Science and Research Branch, Islamic Azad University, Tehran, Iran
Note: [] Corresponding author: A. Salar Elahi, Plasma Physics Research Center, Science and Research Branch, Islamic Azad University, Tehran, Iran. E-mail: Salari_phy@yahoo.com
Abstract: Hard x-ray emission from the Runaway electrons is an important issue in tokamaks. Suggesting methods to reduce the Runaway electrons and therefore the emitted hard x-ray is important for tokamak plasma operation. In this manuscript, we have investigated the effects of external fields on hard x-ray intensity and Magneto-Hydro-Dynamic (MHD) activity. In other words, we have presented the effects of positive biased limiter and Resonant Helical Field (RHF) on the MHD fluctuations and hard x-ray emission from the Runaway electrons. MHD activity and hard x-ray intensity were analyzed using Wavelet transform in the presence of external fields and without them. The results show that the MHD activity and therefore the hard x-ray intensity can be controlled by the external electric and magnetic fields.
Keywords: Tokamak, runaway electrons, x-ray, MHD activity, Wavelet transform
DOI: 10.3233/XST-140462
Journal: Journal of X-Ray Science and Technology, vol. 22, no. 6, pp. 777-783, 2014
IOS Press, Inc.
6751 Tepper Drive
Clifton, VA 20124
USA
Tel: +1 703 830 6300
Fax: +1 703 830 2300
sales@iospress.com
For editorial issues, like the status of your submitted paper or proposals, write to editorial@iospress.nl
IOS Press
Nieuwe Hemweg 6B
1013 BG Amsterdam
The Netherlands
Tel: +31 20 688 3355
Fax: +31 20 687 0091
info@iospress.nl
For editorial issues, permissions, book requests, submissions and proceedings, contact the Amsterdam office info@iospress.nl
Inspirees International (China Office)
Ciyunsi Beili 207(CapitaLand), Bld 1, 7-901
100025, Beijing
China
Free service line: 400 661 8717
Fax: +86 10 8446 7947
china@iospress.cn
For editorial issues, like the status of your submitted paper or proposals, write to editorial@iospress.nl
如果您在出版方面需要帮助或有任何建, 件至: editorial@iospress.nl