Measurement of real and imaginary form factors of silver atom using a high resolution HPGe detector

Article type: Research Article

Authors: Krishnananda, | Niranjana, K.M. | Badiger, N.M.

Affiliations: Department of Studies in Physics, Karnatak University, Dharwad, Karnataka, India

Note: [] Corresponding author: N.M. Badiger, Department of Studies in Physics, Karnatak University, Dharwad, Karnataka 580003, India. Tel.: +91 8362215316; E-mail: nagappa123@yahoo.co.in

Abstract: The real and imaginary form factors of silver atom have been determined by using EDXRF method. The K x-ray photons in the energy range from 8.62 keV to 52.18 keV are generated by sending 59.56 keV gamma photons from ^{241}Am radioactive source on various targets. These K x-ray photons are transmitted through silver foils of suitable thickness. The incident and transmitted K x-ray photon intensities have been measured with a high resolution HPGe detector which is coupled to 16K MCA. The photoelectric cross sections at different K x-ray energies have been determined by measuring the intensities of the incident and transmitted x-ray photons. From these photoelectric cross section values, the imaginary form factors and the real form factors have been determined at various photon energies. Measured imaginary and real form factor values have been compared with theoretical values predicted by XCOM [23] and FFAST [24].

Keywords: Mass attenuation coefficient, HPGe detector, photoelectric cross-section, real and imaginary form factors

DOI: 10.3233/XST-130388

Journal: Journal of X-Ray Science and Technology, vol. 21, no. 4, pp. 557-565, 2013