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Article type: Research Article
Authors: Hu, Yida | Ahmad, Salahuddin | Ali, Imad
Affiliations: Department of Radiation Oncology, University of Oklahoma Health Sciences Center, Oklahoma City, OK, USA
Note: [] Corresponding author: Imad Ali, Department of Radiation Oncology, University of Oklahoma Health Sciences Center, Oklahoma City, OK 73104, USA. E-mail: Imad-Ali@ouhsc.edu
Abstract: With increasing popularity and complexity of intensity-modulated radiation therapy (IMRT) delivery modalities including regular and arc therapies, there is a growing challenge for validating the accuracy of dose distributions. Gafchromic films have superior characteristics for dose verification over other conventional dosimeters. In order to optimize the use of Gafchromic films in clinical IMRT quality assurance procedures, the scanning parameters of EBT and EBT2 films with a flatbed scanner were investigated. The effects of several parameters including scanning position, orientation, uniformity, film sensitivity and optical density (OD) growth after irradiation were quantified. The profiles of the EBT and EBT2 films had a noise level of 0.6% and 0.7%, respectively. Considerable orientation dependence was observed and the scanner value difference between landscape and portrait modes were about 12% and 10% for EBT and EBT2 films, respectively. The highest response sensitivity was observed using digitized red color images of the EBT2 film scanned with landscape mode. The total system non-uniformity composed of contributions from the film and the scanner was less than 1.7%. OD variations showed that EBT gray scale grew slower, however, reached higher growth values of 15% when compared with EBT2 gray scale which grew 12% after a long time (480 hours) post-irradiation. The EBT film using the red color channel showed the minimal growth where OD increased up to 3% within 3 days after irradiation, and took one week to stabilize.
Keywords: EBT Gafchromic film, film sensitivity, non-uniformity, orientation, optical density growth
DOI: 10.3233/XST-2012-00346
Journal: Journal of X-Ray Science and Technology, vol. 20, no. 4, pp. 385-393, 2012
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