Direct-conversion x-ray detectors using amorphous selenium

Issue title: Special Issue on Clinical Applications of Modern Imaging

Article type: Research Article

Authors: Lee, Denny L.Y. | Golden, Kelly P. | Yorker, Jeffrey G. | Davis, Jim | Rodricks, Brian G. | Cheung, Lawrence K. | Jeromin, Lothar S.

Affiliations: Direct Radiography Corporation, a Hologic Company; 600 Technology Drive, Newark, DE 19702, USA

Note: [] Corresponding author: dlee@directradiography.com

Abstract: Direct conversion of x-ray energy into electrical charge has been extensively developed into imaging products in the past few years. Applications include general radiography, mammography, x-ray crystallography, portal imaging, and non-destructive testing. Direct methods avoid intermediate conversion of x-rays into light prior to generating a measurable electrical charge. This eliminates light scattering effects on image sharpness, allowing detectors to be designed to the limit of the theoretical modulation transfer function for a discrete-pixel sensor. Working exposure range can be customized by adjusting bias and thickness of sensor layers in coordination with readout-electronics specifications. Mature amorphous selenium technology and recent progress on high-quality Thin-Film Transistor (TFT) arrays for computer displays have allowed development of practical large-area high-resolution flat-panel x-ray imaging systems. A variety of design optimizations enable direct-conversion technology to satisfy a wide range of applications including dynamic imaging.

Journal: Journal of X-Ray Science and Technology, vol. 10, no. 1-2, pp. 17-36, 2002