In-situ Stress Determination in Thermally-grown Iron Oxide Scales using X-Ray Diffraction of Synchrotron Radiation

Article type: Research Article

Authors: Panicaud, B. | Grosseau-Poussard, J.L. | Renault, P.O. | Dinhut, J.F. | Thiaudière, D. | Gailhanou, M.

Affiliations: LEMMA, Pôle Sciences et Technologie, Université de La Rochelle, Av. M. Crépeau, 17042, La Rochelle cédex 01, France | LMP-CNRS, Université de Poitiers, SP2MI, 86960 Futuroscope cédex, France | LURE, Bât 209D, Université Paris-Sud, BP 34, 91898 Orsay cédex, France

Note: [] Corresponding author. Fax: +33-5-46-45-72-72. E-mail: jlgrouss@univ-lr.fr

Abstract: The development of residual stress in the iron-oxide layers growing on phosphated α-Fe in the temperature range 375–450°C was investigated by in-situ X-ray diffraction of synchrotron radiation during oxide growth. As such, the stress state in the oxide layer for very short oxidation times which corresponds to low thickness of the oxide layer (≤1 µm) has been determined. The microstructural state of the oxide layers is first presented. Then a detailed study of the residual strains in the oxide layers is undertaken. Correlations between the residual stress measurements and the evolution of the microstructural state leads to a better understanding of the oxidation behaviour of phosphated α-Fe.

Keywords: High temperature oxidation, Iron, Synchrotron radiation, Growth and thermal stresses

DOI: 10.1080/10238160410001734469

Journal: Journal of Neutron Research, vol. 12, no. 1-3, pp. 57-61, 2004