Privacy preserving defect prediction using generalization and entropy-based data reduction

Article type: Research Article

Authors: Saifan, Ahmad A. | Lataifeh, Zainab

Affiliations: Information Systems Department, Faculty of IT, Yarmouk University, Irbid, Jordan

Correspondence: [*] Corresponding author: Ahmad A. Saifan, Information Systems, Yarmouk University, Irbid, Jordan. E-mail: ahmads@yu.edu.jo.

Abstract: The software engineering community produces data that can be analyzed to enhance the quality of future software products, and data regarding software defects can be used by data scientists to create defect predictors. However, sharing such data raises privacy concerns, since sensitive software features are usually considered as business assets that should be protected in accordance with the law. Early research efforts on protecting the privacy of software data found that applying conventional data anonymization to mask sensitive attributes of software features degrades the quality of the shared data. In addition, data produced by such approaches is not immune to attacks such as inference and background knowledge attacks. This research proposes a new approach to share protected release of software defects data that can still be used in data science algorithms. We created a generalization (clustering)-based approach to anonymize sensitive software attributes. Tomek link and AllNN data reduction approaches were used to discard noisy records that may affect the usefulness of the shared data. The proposed approach considers diversity of sensitive attributes as an important factor to avoid inference and background knowledge attacks on the anonymized data, therefore data discarded is removed from both defective and non-defective records. We conducted experiments conducted on several benchmark software defect datasets, using both data quality and privacy measures to evaluate the proposed approach. Our findings showed that the proposed approach outperforms existing well-known techniques using accuracy and privacy measures.

DOI: 10.3233/IDA-205504

Journal: Intelligent Data Analysis, vol. 25, no. 6, pp. 1369-1405, 2021