3D profile measurement using color multi-line stripe pattern with one shot scanning

Article type: Research Article

Authors: Sinlapeecheewa, Chanin | Takamasu, Kiyoshi^{; *}

Affiliations: Department of Precision Engineering, The University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo, Japan. Tel.: +81 3 5841 6450; E-mail: takamasu@pe.u-tokyo.ac.jp

Correspondence: [*] Corresponding author.

Abstract: In this paper, we present a new technique of taking a 3D profile measurement using colored structured lighting projection. A pattern of colored stripes was projected onto an object when taking images with cameras from various angles, and then all possible available match information was provided from the acquired images and database of the projection pattern. A correct match was then obtained from the possible available match information by solving the matching problem. The 3D profile was then reconstructed by means of triangulation. The advantage of using color in the pattern is that it simplified the difficult problem of matching using a multiple-line stripe pattern. A systematic color selection procedure was developed. Colors used to generate a color-stripe pattern were selected on a trial for many colors. The problem of finding the correct color stripe correspondence between the light source and images was solved. However, solving the problem required accurate calibration of the system parameters. A technique for camera-projector calibration using calibration points that projected from a projector is presented in this paper. The mean error of the calibration was about 0.2 mm.

DOI: 10.3233/ICA-2005-12402

Journal: Integrated Computer-Aided Engineering, vol. 12, no. 4, pp. 333-341, 2005