Searching for just a few words should be enough to get started. If you need to make more complex queries, use the tips below to guide you.
Article type: Research Article
Authors: Qasim, Tarek | Ford, Chris | Bush, Mark | Hu, Xiao‐Zhi
Affiliations: School of Mechanical Engineering, The University of Western Australia, 35 Stirling Highway, Crawley, WA 6009, Australia
Note: [] Corresponding author. Tel.: +61 8 9380 3601; Fax: +61 8 9380 1024; E‐mail: tqasim@mech.uwa.edu.au.
Abstract: Hertzian contact damage is studied in porcelain coatings (thickness range 250 μm to 1 mm) over a Ni–Cr alloy substrate, and glass coatings (thickness range 160 μm to 1 mm) on polycarbonate polymer substrates. Both planar and non‐planar geometries are considered, subjected to indentation by spherical indenters of various sizes (radius range 2 mm to 8 mm). Finite element analysis is carried out to evaluate the stress distribution in the bilayer structure. Three failure modes are examined: Cone cracking at the top surface of the coating, interface cracking at the coating/substrate interface and plastic deformation below the contact area in the substrate. It is concluded that indenter size, coating thickness, modulus mismatch and specimen radius all require consideration in the prediction of failure in brittle coating bilayer structures. Generally, critical loads increase with indenter size for both planar and non‐planar geometries on stiff substrates, however this effect diminishes for softer (polymeric) substrates. This applies to both planar and non‐planar geometries. In systems with stiff (Ni–Cr alloy) substrates, varying the specimen radius rs has no effect on cone crack critical loads, but increasing rs promotes increased critical loads for radial cracking and substrate yielding.
Keywords: Finite element analysis, indentation, crack, shape irregularity, bilayer
Journal: Strength, Fracture and Complexity, vol. 2, no. 2, pp. 81-93, 2004
IOS Press, Inc.
6751 Tepper Drive
Clifton, VA 20124
USA
Tel: +1 703 830 6300
Fax: +1 703 830 2300
sales@iospress.com
For editorial issues, like the status of your submitted paper or proposals, write to editorial@iospress.nl
IOS Press
Nieuwe Hemweg 6B
1013 BG Amsterdam
The Netherlands
Tel: +31 20 688 3355
Fax: +31 20 687 0091
info@iospress.nl
For editorial issues, permissions, book requests, submissions and proceedings, contact the Amsterdam office info@iospress.nl
Inspirees International (China Office)
Ciyunsi Beili 207(CapitaLand), Bld 1, 7-901
100025, Beijing
China
Free service line: 400 661 8717
Fax: +86 10 8446 7947
china@iospress.cn
For editorial issues, like the status of your submitted paper or proposals, write to editorial@iospress.nl
如果您在出版方面需要帮助或有任何建, 件至: editorial@iospress.nl