Quantitative oscillator analysis of IR-optical spectra on spin-cast chitosan films

Article type: Research Article

Authors: Nosal, W.H. | Thompson, D.W. | Sarkar, S. | Subramanian, A. | Woollam, J.A.^;

Affiliations: Department of Electrical Engineering, University of Nebraska, Lincoln, NE 68588, USA | Department of Chemical Engineering, University of Nebraska, Lincoln, NE 68588, USA

Note: [] Corresponding author. Tel.: +1 402 477 7501, ext. 227; Fax: +1 402 477 8214; E-mail: jwoollam@jawoollam.com.

Abstract: Infrared optical properties of spin-cast chitosan films have been determined using spectroscopic ellipsometry. Infrared index of refraction and extinction coefficients from 750 cm−1 to 4000 cm−1 were determined using ellipsometric data fits to dispersion models based on Gaussian shaped oscillators. The free electron contribution was analyzed using a Drude model. This modeling determined that optical anisotropy was present over the entire infrared region. Line shape and oscillator strength analysis was performed to determine oscillator strengths, abundance, and relative bond strength.

Keywords: Bond occurrence, chitosan, ellipsometry, infrared spectrum, oscillator strength

Journal: Spectroscopy, vol. 19, no. 5-6, pp. 267-274, 2005