Searching for just a few words should be enough to get started. If you need to make more complex queries, use the tips below to guide you.
Issue title: International Conference on Structural Engineering Dynamics – ICEDyn 2011
Article type: Research Article
Authors: Lopes, H. | Ribeiro, J. | Araújo dos Santos, J.V.
Affiliations: ESTIG, Instituto Politécnico de Bragança, Campus de Sta. Apolónia, Bragança, Portugal | IDMEC, Instituto Superior Técnico, Universidade Técnica de Lisboa, Lisboa, Portugal
Note: [] Correctonding author: J.V. Araújo dos Santos, Instituto Superior Técnico, Universidade Técnica de Lisboa, Av. Rovisco Pais, 1049-001 Lisboa, Portugal. E-mail: viriato@ist.utl.pt
Abstract: This paper describes several interferometric techniques and their applications in structural damage identification. With that objective in mind, damaged aluminum beams with clamped-free and free-free boundary conditions are analyzed. Different damages cases are inflicted by creating small cuts perpendicular to the beams longitudinal axis, being the damage, therefore, characterized by the dimensions of these cuts. The out-of-plane displacement field of modal response is measured with an electronic speckle pattern interferometric system. The static and dynamic rotation fields, defined as the spatial derivative of the displacement field, are measured with two different speckle shearography systems. Second and third order spatial derivatives of the displacement field, which are related to the bending moment and shear force, are computed by differentiation techniques. The cuts locations are determined by looking for maximum values and/or perturbations of damage indicators based on bending moments and shear forces. This method is validated by comparing its results with numerical ones, from which the most suitable interferometric technique is chosen.
Keywords: Damage identification, ESPI, speckle shearography, higher order spatial derivatives, beam
DOI: 10.3233/SAV-2012-0692
Journal: Shock and Vibration, vol. 19, no. 5, pp. 835-844, 2012
IOS Press, Inc.
6751 Tepper Drive
Clifton, VA 20124
USA
Tel: +1 703 830 6300
Fax: +1 703 830 2300
sales@iospress.com
For editorial issues, like the status of your submitted paper or proposals, write to editorial@iospress.nl
IOS Press
Nieuwe Hemweg 6B
1013 BG Amsterdam
The Netherlands
Tel: +31 20 688 3355
Fax: +31 20 687 0091
info@iospress.nl
For editorial issues, permissions, book requests, submissions and proceedings, contact the Amsterdam office info@iospress.nl
Inspirees International (China Office)
Ciyunsi Beili 207(CapitaLand), Bld 1, 7-901
100025, Beijing
China
Free service line: 400 661 8717
Fax: +86 10 8446 7947
china@iospress.cn
For editorial issues, like the status of your submitted paper or proposals, write to editorial@iospress.nl
如果您在出版方面需要帮助或有任何建, 件至: editorial@iospress.nl