Searching for just a few words should be enough to get started. If you need to make more complex queries, use the tips below to guide you.
Article type: Research Article
Authors: Hanagal, David D.
Affiliations: Department of Statistics, Savitribai Phule Pune University, Pune, India | E-mail: david.hanagal@gmail.com
Correspondence: [*] Corresponding author: Department of Statistics, Savitribai Phule Pune University, Pune, India. E-mail: david.hanagal@gmail.com.
Abstract: Shared frailty models are used despite their limitations. To overcome their disadvantages correlated frailty models may be used. In this paper, we introduce the correlated compound Poisson frailty models with two different baseline distributions namely, the generalized log logistic and the generalized Weibull. We introduce the Bayesian estimation procedure using Markov Chain Monte Carlo (MCMC) technique to estimate the parameters involved in these models. We present a simulation study to compare the true values of the parameters with the estimated values. Also we apply these models to a real life bivariate survival data set of McGilchrist and Aisbett (1991) related to the kidney infection data and a better model is suggested for the data.
Keywords: Bayesian estimation, correlated compound poisson frailty, generalized log-logistic distribution, generalized Weibull distribution, kidney infection data, model selection criteria
DOI: 10.3233/MAS-231452
Journal: Model Assisted Statistics and Applications, vol. 19, no. 2, pp. 159-171, 2024
IOS Press, Inc.
6751 Tepper Drive
Clifton, VA 20124
USA
Tel: +1 703 830 6300
Fax: +1 703 830 2300
sales@iospress.com
For editorial issues, like the status of your submitted paper or proposals, write to editorial@iospress.nl
IOS Press
Nieuwe Hemweg 6B
1013 BG Amsterdam
The Netherlands
Tel: +31 20 688 3355
Fax: +31 20 687 0091
info@iospress.nl
For editorial issues, permissions, book requests, submissions and proceedings, contact the Amsterdam office info@iospress.nl
Inspirees International (China Office)
Ciyunsi Beili 207(CapitaLand), Bld 1, 7-901
100025, Beijing
China
Free service line: 400 661 8717
Fax: +86 10 8446 7947
china@iospress.cn
For editorial issues, like the status of your submitted paper or proposals, write to editorial@iospress.nl
如果您在出版方面需要帮助或有任何建, 件至: editorial@iospress.nl