Affiliations: [a] Department of Mathematics, Koç University, Sariyer, 34450, Istanbul, Turkey | [b] Department of Applied Mathematics and Statistics, The Johns Hopkins University, Baltimore, MD, 21218, USA
Note: [1] This research was supported by the Defense Advanced Research Projects Agency as administered by the Air Force Office of Scientific Research under contract DOD F49620-99-1-0213 and by Office of Naval Research Grant N00014-95-1-0777.
Abstract: We derive the asymptotic distribution of the domination number of a new family of random digraph called proximity catch digraph (PCD), which has application to statistical testing of spatial point patterns and to pattern recognition. The PCD we use is a parametrized digraph based on two sets of points on the plane, where sample size and locations of the elements of one is held fixed, while the sample size of the other whose elements are randomly distributed over a region of interest goes to infinity. PCDs are constructed based on the relative allocation of the random set of points with respect to the Delaunay triangulation of the other set whose size and locations are fixed. We introduce various auxiliary tools and concepts for the derivation of the asymptotic distribution. We investigate these concepts in one Delaunay triangle on the plane, and then extend them to the multiple triangle case. The methods are illustrated for planar data, but are applicable in higher dimensions also.
