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Article type: Research Article
Authors: Chernov, V. A. | Chkhalo, N. I. | Fedorchenko, M. V. | Kruglyakov, E. P. | Mytnichenko, S. V. | Nikitenko, S. G.
Affiliations: Siberian SR Centre at Budker Institute of Nuclear Physics, Lavrenlyev Avenue II, Novosibirsk, 630090, Russia
Abstract: In the present work we have used the EXAFS and SAXS methods to study the inner structure of “classical” Co/C and Ni/C multilayers. This enabled us to study in detail the structure of a multilayer as a function of the thickness of a metal layer within the multilayer. On the basis of these data a model for multilayer growth produced with pulsed laser evaporation technology is proposed.
DOI: 10.3233/XST-1995-5106
Journal: Journal of X-Ray Science and Technology, vol. 5, no. 1, pp. 65-72, 1995
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