Affiliations: [a] Henan Key Laboratory of Imaging and Intelligent Processing, PLA Strategy Support Force Information Engineering University, Zhengzhou, Henan, China
| [b]
College of Information Science and Engineering, Henan University of Technology, Zhengzhou, Henan, China
Correspondence:
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Corresponding author: Bin Yan, Henan Key Laboratory of Imaging and Intelligent Processing, PLA Strategy Support Force Information Engineering University, Zhengzhou, Henan, China. E-mail: ybspace@hotmail.com.
Abstract: BACKGROUND:X-ray cone-beam computed laminography (CL) is widely used for large flat objects that computed tomography (CT) cannot investigate. The rotation angle of axis tilt makes geometric correction of CL system more complicated and has more uncertain factors. Therefore, it is necessary to evaluate sensitivity of the geometric parameters of CL system in advance. OBJECTIVE:This study aims to objectively and comprehensively evaluate sensitivity of CL geometric parameters based on the projection trajectory. METHODS:This study proposes the Minimum Deviation Unit (MDU) to evaluate sensitivity of CL geometric parameters. First, the projection trajectory formulas are derived according to the spatial relationship of CL system geometric parameters. Next, the MDU of the geometric parameters is obtained based on the projection trajectories and used as the evaluation index to measure the sensitivity of parameters. Then, the influence of the rotation angle of the axis tilt and magnification on the MDU of the parameters is analyzed. RESULTS:At low magnification, three susceptible parameters (η, u0, v0) with MDU less than 1 (° or mm) must be calibrated accurately to avoid geometric artifacts. The sensitivity of CL parameters increases as the magnification increases, and all parameters become highly sensitive when the magnification power is greater than 10. CONCLUSION:The results of this study have important guiding significance for the subsequent further parameter calibration.
