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Article type: Research Article
Authors: Feng, Zhiweia; b | Cai, Ailongb | Wang, Yizhongb | Li, Leib; * | Tong, Lib | Yan, Binb
Affiliations: [a] Zhong Yuan Network Security Research Institute, Zhengzhou University, Zhengzhou, Henan, China | [b] Henan Key Laboratory of Imaging and Intelligent Processing, PLA Strategy Support Force Information Engineering University, Zhengzhou, Henan, China
Correspondence: [*] Corresponding author: Lei Li, Henan Key Laboratory of Imaging and Intelligent Processing, PLA Strategy Support Force Information Engineering University, Zhengzhou, Henan, China. E-mail: leehotline@163.com.
Abstract: The excessive radiation doses in the application of computed tomography (CT) technology pose a threat to the health of patients. However, applying a low radiation dose in CT can result in severe artifacts and noise in the captured images, thus affecting the diagnosis. Therefore, in this study, we investigate a dual residual convolution neural network (DRCNN) for low-dose CT (LDCT) imaging, whereby the CT images are reconstructed directly from the sinogram by integrating analytical domain transformations, thus reducing the loss of projection information. With this new framework, feature extraction is performed simultaneously on both the sinogram-domain sub-net and the image-domain sub-net, which utilize the residual shortcut networks and play a complementary role in suppressing the projection noise and reducing image error. This new DRCNN approach helps not only decrease the sinogram noise but also preserve significant structural information. The experimental results of simulated and real projection data demonstrate that our DRCNN achieve superior performance over other state-of-art methods in terms of visual inspection and quantitative metrics. For example, comparing with RED-CNN and DP-ResNet, the value of PSNR using our DRCNN is improved by nearly 3 dB and 1 dB, respectively.
Keywords: Low-dose CT, image denoising, deep learning, residual network
DOI: 10.3233/XST-200777
Journal: Journal of X-Ray Science and Technology, vol. 29, no. 1, pp. 91-109, 2021
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