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Article type: Research Article
Authors: Zhao, Xianyua; b | Jiang, Changhuia | Zhang, Qiyanga | Ge, Yongshuaia | Liang, Donga | Liu, Xina | Yang, Yongfenga | Zheng, Haironga | Hu, Zhanlia; *
Affiliations: [a] Lauterbur Research Center for Biomedical Imaging, Shenzhen Institutes of Advanced Technology, Chinese Academy of Sciences, Shenzhen, China | [b] School of Information Engineering, Wuhan University of Technology, Wuhan, China
Correspondence: [*] Corresponding author: Zhanli Hu, Lauterbur Research Center for Biomedical Imaging, Shenzhen Institutes of Advanced Technology, Chinese Academy of Sciences, Shenzhen 518055, China. E-mail: zl.hu@siat.ac.cn.
Abstract: Recently, low-dose computed tomography (CT) has become highly desirable due to the increasing attention paid to the potential risks of excessive radiation of the regular dose CT. However, ensuring image quality while reducing the radiation dose in the low-dose CT imaging is a major challenge. Compared to classical filtered back-projection (FBP) algorithms, statistical iterative reconstruction (SIR) methods for modeling measurement statistics and imaging geometry can significantly reduce the radiation dose, while maintaining the image quality in a variety of CT applications. To facilitate low-dose CT imaging, we in this study proposed an improved statistical iterative reconstruction scheme based on the penalized weighted least squares (PWLS) standard combined with total variation (TV) minimization and sparse dictionary learning (DL), which is named as a method of PWLS-TV-DL. To evaluate this PWLS-TV-DL method, we performed experiments on digital phantoms and physical phantoms, and analyzed the results in terms of image quality and calculation. The results show that the proposed method is better than the comparison methods, which indicates the potential of applying this PWLS-TV-DL method to reconstruct low-dose CT images.
Keywords: Low dose computed tomography, penalized weighted least squares, total variation, dictionary learning
DOI: 10.3233/XST-180477
Journal: Journal of X-Ray Science and Technology, vol. 27, no. 3, pp. 573-590, 2019
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