Fast estimation of first-order scattering in a medical x-ray computed tomography scanner using a ray-tracing technique

Article type: Research Article

Authors: Liu, Xin

Affiliations: Nuclear Engineering, Missouri University of Science and Technology, 301 W14th Street, Rolla, MO 65401, USA. Tel.: +1 573 341 4693; Fax: +1 573 341 4720; E-mail: xinliu@mst.edu

Abstract: This study describes a deterministic method for simulating the first-order scattering in a medical computed tomography scanner. The method was developed based on a physics model of x-ray photon interactions with matter and a ray tracing technique. The results from simulated scattering were compared to the ones from an actual scattering measurement. Two phantoms with homogeneous and heterogeneous material distributions were used in the scattering simulation and measurement. It was found that the simulated scatter profile was in agreement with the measurement result, with an average difference of 25% or less. Finally, tomographic images with artifacts caused by scatter were corrected based on the simulated scatter profiles. The image quality improved significantly.

Keywords: x-ray computed tomography, scattering, deterministic simulation, ray tracing

DOI: 10.3233/XST-140460

Journal: Journal of X-Ray Science and Technology, vol. 22, no. 6, pp. 763-772, 2014