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Article type: Research Article
Authors: Zhang, Yi | Pu, Yi-Fei | Hu, Jin-Rong | Liu, Yan | Zhou, Ji-Liu
Affiliations: College of Computer Science, Sichuan University, Chengdu, China | School of Electronics And Information Engineering, Sichuan University, Chengdu, China
Note: [] Corresponding author: Yi Zhang, No. 24, south 1st part of 1st Ring Road, College of Computer Science, Sichuan University, Chengdu, 610065, China. Tel.: +86 13880621483; Fax: +86 028 86635137; E-mail: maybe198376@gmail.com
Abstract: In this paper, we propose a new metal artifacts reduction algorithm based on fractional-order total-variation sinogram inpainting model for X-ray computed tomography (CT). The numerical algorithm for our fractional-order framework is also analyzed. Simulations show that, both quantitatively and qualitatively, our method is superior to conditional interpolation methods and the classic integral-order total variation model.
Keywords: Metal artifacts reduction, image inpainting, total variation, fractional order, X-ray computed tomography
DOI: 10.3233/XST-2011-0300
Journal: Journal of X-Ray Science and Technology, vol. 19, no. 3, pp. 373-384, 2011
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