Affiliations: NIST Center for Neutron Research, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA | University of Maryland, College Park, MD 20742, USA
Note: [] Corresponding author. NIST Center for Neutron Research, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.
Abstract: We have developed a new technique for polarized neutron diffraction utilizing a two-dimensional, area-sensitive detector. An area-sensitive detector, used in conjunction with a transmission polarizer in the scattered beam, allows us to simultaneously measure non-spin-flip (NSF) and spin-flip (SF) scattering processes and therefore increases the data collection rate by a factor of two. An experimental test was performed on a single crystal of La5/3Srl/3NiO4 which demonstrates the advantages of this method over conventional means of polarized neutron analysis.
