Searching for just a few words should be enough to get started. If you need to make more complex queries, use the tips below to guide you.
Article type: Research Article
Authors: Jauch, W.
Affiliations: Hahn-Meitner-Institut, Glienicker Str. 100,D-14109 Berlin, Germany
Note: [] Fax: (49) 30-8062-2999. E-mail: jauch@hmi.de
Abstract: The expected performance of single-crystal time-of-flight diffraction at a potential long pulse spallation source is discussed for both small and large-unit-cell structures. The requirements and capabilities in biomacromolecular structure analysis at high, atomic resolution are focused on. Data collection times are predicted on the basis of a detailed evaluation of the counting-statistical quality of a complete data set. It is found that a long pulse source would excel the capabilities at the best existing steady state source. Most promising for advances in the more challenging structural problems, however, looks a short pulse spallation source with an intermediate-temperature coupled moderator.
Keywords: time-of-flight diffraction, Laue technique, single-crystal diffraction, protein crystallography, pulsed neutron sources, long pulse spallation source
DOI: 10.1080/10238169708200105
Journal: Journal of Neutron Research, vol. 6, no. 1-3, pp. 161-171, 1997
IOS Press, Inc.
6751 Tepper Drive
Clifton, VA 20124
USA
Tel: +1 703 830 6300
Fax: +1 703 830 2300
sales@iospress.com
For editorial issues, like the status of your submitted paper or proposals, write to editorial@iospress.nl
IOS Press
Nieuwe Hemweg 6B
1013 BG Amsterdam
The Netherlands
Tel: +31 20 688 3355
Fax: +31 20 687 0091
info@iospress.nl
For editorial issues, permissions, book requests, submissions and proceedings, contact the Amsterdam office info@iospress.nl
Inspirees International (China Office)
Ciyunsi Beili 207(CapitaLand), Bld 1, 7-901
100025, Beijing
China
Free service line: 400 661 8717
Fax: +86 10 8446 7947
china@iospress.cn
For editorial issues, like the status of your submitted paper or proposals, write to editorial@iospress.nl
如果您在出版方面需要帮助或有任何建, 件至: editorial@iospress.nl