Two-Axis Neutron and X-Ray Reflectivity: How to Avoid Alignment Pitfalls and How to Correct for Them

Article type: Research Article

Authors: Bouwman, Wim G. | Vigild, Martin E. | Findeisen, Eberhard | Kjaer, Kristian | Feidenhans’l, Robert | Mol, Elisabeth A.L.

Affiliations: Physics Department, Risø National Laboratory; DK-4000 Roskilde, Denmark | FOM-Institute for Atomic and Molecular Physics, Kruislaan 407, 1098 SJ Amsterdam, The Netherlands

Abstract: Sample alignment for neutron (and in some cases x-ray) reflectometry can be complicated due to a coupling between angle and position which occurs when slits are used to define the path of the beam. Misalignments in sample position or sample rotation angle give rise to systematic errors in the experiments. By measuring the reflectivity both from the back and from the front faces of the sample (twin reflectometry) these alignment errors can be detected and corrected for.

DOI: 10.1080/10238169708200219

Journal: Journal of Neutron Research, vol. 5, no. 3, pp. 133-146, 1997