Searching for just a few words should be enough to get started. If you need to make more complex queries, use the tips below to guide you.
Article type: Research Article
Authors: Wang, Y.D.; | Ren, Y. | Li, H. | Cong, D.Y. | Choo, H. | Liaw, P.K. | Lin Peng, R. | Zuo, L.
Affiliations: Department of Materials Science and Engineering, The University of Tennessee, Knoxville, TN 37996, USA | School of Materials and Metallurgy, Northeastern University, Shenyang 110004, P.R. China | Experimental Facilities Division, Argonne National Laboratory, Argonne, IL 60439, USA | Department of Mechanical Engineering, Linköping University, S-58183 Linköping, Sweden
Note: [] Corresponding author. Email: ydwang@mail.neu.edu.cn
Abstract: The neutron diffraction method and the synchrotron high-energy X-ray diffraction technique provide global and local measurements of textures and residual stresses in both structural and functional materials under various environments. In this paper, we present the in situ measurements in ferromagnetic shape-memory alloys during phase transformation, which reveal the good “memory” of textures and stresses.
Keywords: Ferromagnetic shape-memory alloy, Texture, Stress, Neutron diffraction, Synchrotron high-energy X-ray diffraction
DOI: 10.1080/10238160802399654
Journal: Journal of Neutron Research, vol. 15, no. 3, 4, pp. 193-197, 2007
IOS Press, Inc.
6751 Tepper Drive
Clifton, VA 20124
USA
Tel: +1 703 830 6300
Fax: +1 703 830 2300
sales@iospress.com
For editorial issues, like the status of your submitted paper or proposals, write to editorial@iospress.nl
IOS Press
Nieuwe Hemweg 6B
1013 BG Amsterdam
The Netherlands
Tel: +31 20 688 3355
Fax: +31 20 687 0091
info@iospress.nl
For editorial issues, permissions, book requests, submissions and proceedings, contact the Amsterdam office info@iospress.nl
Inspirees International (China Office)
Ciyunsi Beili 207(CapitaLand), Bld 1, 7-901
100025, Beijing
China
Free service line: 400 661 8717
Fax: +86 10 8446 7947
china@iospress.cn
For editorial issues, like the status of your submitted paper or proposals, write to editorial@iospress.nl
如果您在出版方面需要帮助或有任何建, 件至: editorial@iospress.nl