Affiliations: Department of CSE, Vel Tech Rangarajan Dr. Sagunthala R&D Institute of Science and Technology, Chennai, India
Correspondence:
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Corresponding author. A.V. Anandhalekshmi, Research Scholar, Department of CSE, Vel Tech Rangarajan Dr. Sagunthala R&D Institute of Science and Technology, Chennai, India. E-mail: anandhalekshmi11@gmail.com.
Abstract: Internet of Things (IoT) based healthcare monitoring system is becoming the present and the future of the medical field around the world. Here the monitoring system acquires the regular health details of hospital discharged patients like elderly patients, patients out of critical operations, and patients from remote areas, etc., and transmits it to the doctors. But the system is highly susceptible to sensor faults. Hence a data-driven hybrid approach of Hidden Markov Model (HMM) based on baum-welch algorithm with Support Vector Machine (SVM) is proposed to predict the abnormality caused by the medical sensors. The proposed work first perform the abnormality detection on the sensor data using the HMM based on baum-welch algorithm in which the normal data is separated from abnormal data followed by classifying the abnormal data as critical patient data or sensor fault data using the SVM. Here the proposed work efficiently performs fault diagnosis with an overall accuracy of 99.94% which is 0.59% better than the existing SVM model. And also a comparison is made between the hybrid approach and the existing ML algorithms in terms of recall and F1-score where the proposed approach outperforms the other algorithms with a recall value of 100% and F1-score of 99.7%.
Keywords: Internet of Things, Healthcare, Fault diagnosis, Hidden Markov Model, Baum-Welch algorithm, Support Vector Machine
