Affiliations: Science and Technology on Reliability and Environmental Engineering Laboratory, School of Reliability and Systems Engineering, Beihang University, Beijing, China
Correspondence:
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Corresponding author. Xiaoyang Li, Science and Technology on Reliability and Environmental Engineering Laboratory, School of Reliability and Systems Engineering, Beihang University, Beijing 100191, China. Tel./Fax: +86 10 82338651; E-mail: leexy@buaa.edu.cn.
Abstract: Accelerated degradation testing (ADT) has been widely used to accelerate failure/degradation processes and to quickly evaluate the reliability and lifetime of products. In particular, the application of copula function provides a convenient and efficient way to model the ADT data of products that have two or more s-dependent degradation measures. However, little effort has focused on the pointwise infimum and supremum of the multivariate joint-distribution function. For this paper, a novel prognostics method was developed for bivariate ADT data on the basis of Brownian motion and time-varying copula method, which can estimate the pointwise best-possible bounds on bivariate joint reliable life function with a given measure of association, such as Kendall’s τ or Spearman’s ρ. The proposed model is applied to the real ADT data of microwave assembly to illustrate its performance and effectiveness.
Keywords: Prognostics, ADT, s-dependency, time-varying copula, reliable life bounds
