Fault diagnosis in optical networks

Article type: Research Article

Authors: Katzela, Irene | Ellinas, Georgios | Yoon, Won Sang | Stern, Thomas E.

Affiliations: Lucent Technologies, Toronto, Canada | Tellium Inc, Oceanport, NJ 07757, USA | MIT, Cambridge, MA, USA | Department of EE, Columbia University, New York, NY 10027, USA

Abstract: Faults in the optical network environment propagate quickly to different parts of the network raising a large number of alarms. This paper describes two new fault diagnosis techniques for single fault diagnosis in an optical network. Both techniques operate under the same premises: when a fault occurs, a central manager detects the fault and through tests and correlation of information identifies the failure. The performance of the proposed schemes is compared both analytically and by simulation to each other and other proposed schemes for fault diagnosis in the optical network environment.

Journal: Journal of High Speed Networks, vol. 10, no. 4, pp. 269-291, 2001