Affiliations: [a] Information Center, Jiangsu University of Technology, Changzhou, Jiangsu, China | [b] School of Electronic Engineering, Changzhou College of Information Technology, Changzhou, Jiangsu, China
Correspondence:
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Corresponding author: Lian Wu, School of Electronic Engineering, Changzhou College of Information Technology, Changzhou, Jiangsu 213000, China. E-mail: wulian7941085@126.com.
Abstract: The defect detection of 3D image of nano CT under different interference has the phenomenon of prominent dislocation. Therefore, an adaptive detection method of 3D image defect of nano CT based on wavelet decomposition is proposed. Analyze the noise of three-dimensional image of nano CT, determine the mixed filtering of image sequence according to the different noise properties, evaluate the mixed filtering of image sequence, complete the preprocessing of three-dimensional image of nano CT, fuse the three-dimensional image of nano CT decomposed by wavelet after preprocessing, enhance the image after decomposition, and realize the defect adaptive detection through the characteristics of wavelet decomposition. The experimental results show that the design method can effectively detect the interference and solve the problems of traditional methods.
