Searching for just a few words should be enough to get started. If you need to make more complex queries, use the tips below to guide you.
Issue title: III Congress of Theoretical and Computational Physical Chemistry, 2–4 December 2010, Altos de Pipe, Caracas, Venezuela
Guest editors: Humberto Soscunxy, Fernando Ruettez and Anibal Sierraltaz
Article type: Research Article
Authors: López-Planes, R.; * | Dasilva, S.
Affiliations: Laboratorio De Metales, Departamento de Física, Escuela de Ciencias, Universidad de Oriente, Apartado postal 245, Cumaná, Venezuela | [x] Centro Tecnológico, Instituto Venezolano de Investigaciones Científicas, IVIC, Caracas, Venezuela | [y] Departamento de Química, Facultad Experimental de Ciencias, La Universidad del Zulia LUZ, Maracaibo, Venezuela | [z] Centro de Química, Instituto Venezolano de Investigaciones Científicas, IVIC, Caracas, Venezuela
Correspondence: [*] Corresponding author: R. López-Planes, Laboratorio De Metales, Departamento de Física, Escuela de Ciencias, Universidad de Oriente, Apartado postal 245, Cumaná, 6101, Venezuela. E-mail: rlopez@udo.edu.ve.
Abstract: The carbon nanotubes have attracted much interest for their electronic properties which go from metallic to semiconducting behavior, depending both on diameter, number of layers and chirality. The value of their band gap is obviously a crucial point to be addressed because it enters in the nanbotube application as microelectronic devices. This work was developed through an estimate of the behavior of the electronic structure of carbon nanotubes of single walled (8,0) and the assessment of electrical conduction through various methodologies such as LSDA, B3PW91, B3LYP and HF ab initio methods and PM3 and AM1semi-empirical methods. The methods showed similarities with the geometrical parameters reported in the literature. The hybrid methods based on density functional generated a good approximation in the energy gap value of single-walled carbon nanotubes (8,0). Results will be presented.
Keywords: Carbon nanotubes, electrical conduction, chirality
DOI: 10.3233/JCM-2012-0426
Journal: Journal of Computational Methods in Sciences and Engineering, vol. 12, no. 4-6, pp. 383-389, 2012
IOS Press, Inc.
6751 Tepper Drive
Clifton, VA 20124
USA
Tel: +1 703 830 6300
Fax: +1 703 830 2300
sales@iospress.com
For editorial issues, like the status of your submitted paper or proposals, write to editorial@iospress.nl
IOS Press
Nieuwe Hemweg 6B
1013 BG Amsterdam
The Netherlands
Tel: +31 20 688 3355
Fax: +31 20 687 0091
info@iospress.nl
For editorial issues, permissions, book requests, submissions and proceedings, contact the Amsterdam office info@iospress.nl
Inspirees International (China Office)
Ciyunsi Beili 207(CapitaLand), Bld 1, 7-901
100025, Beijing
China
Free service line: 400 661 8717
Fax: +86 10 8446 7947
china@iospress.cn
For editorial issues, like the status of your submitted paper or proposals, write to editorial@iospress.nl
如果您在出版方面需要帮助或有任何建, 件至: editorial@iospress.nl