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Issue title: Electromagnetic Fields in Mechatronics, Electrical and Electronic Engineering
Guest editors: P. Di Barba, Roberto Galdi, M.E. Mognaschi and S. Wiak
Article type: Research Article
Authors: Lodro, Mira | Korunur Engiz, Begumb; | Thomas, David W.P.a
Affiliations: [a] GGIEMR, University of Nottingham, Nottingham, UK | [b] Ondokuz Mayıs University, Department of Electrical and Electronics Engineering, Samsun, Turkey
Correspondence: [*] Corresponding author: Begum Korunur Engiz, Ondokuz Mayis University, Faculty of Engineering, Department of Electrical and Electronics Engineering, 55200, Atakum, Samsun, Türkiye. E-mail: bkengiz@omu.edu.tr
Abstract: Reliable, repeatable, and flexible testing is crucial for assessing system performance and ensuring the quality of communication. In reverberation chambers (RC), real-life propagation environments can be emulated by loading absorbers, facilitating controlled testing of the system. This work presents over-the-air (OTA) testing of the LTE-A PHY layer in the RC. We assessed the performance of the LTE-A link using key performance indicators (KPIs) such as error vector magnitude (EVM), bit error rate (BER), and signal-to-noise ratio (SNR) for varying transmitter (Tx) and receiver (Rx) gains. Additionally, we have compared the results both in an empty RC and when the RC was loaded with RF absorbers. We used software-defined radio (SDR) for OTA transmission of LTE-A frames. The measurement results indicate that loading the RC with RF absorbers improves EVM, BER, and SNR. We also quantified the performance of the LTE-A link by changing the position of RF absorbers. Results showed that loading absorbers yielded up to 72.8% improvement in EVM, and placing absorbers closer to Rx helped reduce the amount of multipath, resulting in better transmission performance.
Keywords: Reverberation chamber (RC), over-the-air (OTA), error vector magnitude (EVM), bit error rate (BER), signal-to-noise ratio (SNR)
DOI: 10.3233/JAE-230265
Journal: International Journal of Applied Electromagnetics and Mechanics, vol. 76, no. 1-2, pp. 135-146, 2024
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