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Issue title: 26th International Workshop on Electromagnetic Nondestructive Evaluation
Guest editors: Theodoros Theodoulidis, Christophe Reboud and Christos Antonopoulos
Article type: Research Article
Authors: Tamburrino, Antonelloa; b; | Mottola, Vincenzoc
Affiliations: [a] Department of Electrical and Information Engineering, University of Cassino and Southern Lazio, Cassino, Italy | [b] Department of Electrical and Computer Engineering, Michigan State University, East Lansing, MI, USA | [c] Department of Electrical and Information Engineering, University of Cassino and Southern Lazio, Cassino, Italy
Correspondence: [*] Corresponding author: Antonello Tamburrino, Department of Electrical and Information Engineering, University of Cassino and Southern Lazio, Cassino, Italy. E-mail: antonello.tamburrino@unicas.it, tamburrino@unicas.it
Abstract: In this work, we present a new non-iterative imaging method for Electrical Resistance Tomography (ERT). The problem in ERT is retrieving the spatial behaviour of the electrical conductivity by means of boundary measurements in steady-state conditions. Specifically, the interest is focused on the inverse obstacle problem, that consists in reconstructing the shape, position and dimension of one or more anomalies embedded in a known background. The proposed method, called Kernel Method, is based on the idea that if there exists a current density Jn that applied at the boundary ∂𝛺 of the domain under investigation 𝛺 produces the same scalar potential (on ∂𝛺), with and without anomalies, then the power density corresponding to Jn, evaluated on a configuration without anomalies, is vanishing in the region occupied by the latter. The proposed method has a very low computational cost. Indeed, the evaluation of the desired current density Jn on ∂𝛺 requires a negligible computational effort, and the reconstructions require only one forward problem.
Keywords: Inverse problems, electrical resistance tomography, non-iterative imaging method, NtD
DOI: 10.3233/JAE-230167
Journal: International Journal of Applied Electromagnetics and Mechanics, vol. 74, no. 4, pp. 441-446, 2024
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