Searching for just a few words should be enough to get started. If you need to make more complex queries, use the tips below to guide you.
Issue title: 26th International Workshop on Electromagnetic Nondestructive Evaluation
Guest editors: Theodoros Theodoulidis, Christophe Reboud and Christos Antonopoulos
Article type: Research Article
Authors: Baskaran, Prashantha; | Ramos, Helena Geirinhasa | Ribeiro, Artur Lopesa
Affiliations: [a] Instituto de Telecomunicações, Instituto Superior Tecnico, Universidade de Lisboa, Lisboa, Portugal
Correspondence: [*] Corresponding author: Prashanth Baskaran, Instituto de Telecomunicações, Instituto Superior Tecnico, Universidade de Lisboa, 1049-001 Lisboa, Portugal. E-mail: prashanth.baskaran@tecnico.ulisboa.pt
Abstract: Probability of Detection (PoD) models, in general, take into consideration one or multiple flaw parameters such as its length, maximum depth, and/or maximum surface area, and one flaw signal. However, due to correlation between the response signals, it might be necessary to consider multiple flaw response signals simultaneously. Hence, in this work, we demonstrate the possibility of including multiple correlated flaw signals, features, towards the construction of a PoD curve. The flaw features considered are the 3 components of the magnetic flux density. This is a simulation based PoD estimation for a narrow opening notch type flaw located in the sub-surface of a two-layer geometry. The inspection is carried out by an uniform eddy current probe that induces a spatially uniform fields into the conducting space, around the region of interest. The analysis was performed using the semi-analytical boundary element method (BEM).
Keywords: Boundary element method (BEM), electric dipoles, magnetic-electric Green’s functions, Probability of Detection (PoD)
DOI: 10.3233/JAE-230134
Journal: International Journal of Applied Electromagnetics and Mechanics, vol. 74, no. 4, pp. 343-349, 2024
IOS Press, Inc.
6751 Tepper Drive
Clifton, VA 20124
USA
Tel: +1 703 830 6300
Fax: +1 703 830 2300
sales@iospress.com
For editorial issues, like the status of your submitted paper or proposals, write to editorial@iospress.nl
IOS Press
Nieuwe Hemweg 6B
1013 BG Amsterdam
The Netherlands
Tel: +31 20 688 3355
Fax: +31 20 687 0091
info@iospress.nl
For editorial issues, permissions, book requests, submissions and proceedings, contact the Amsterdam office info@iospress.nl
Inspirees International (China Office)
Ciyunsi Beili 207(CapitaLand), Bld 1, 7-901
100025, Beijing
China
Free service line: 400 661 8717
Fax: +86 10 8446 7947
china@iospress.cn
For editorial issues, like the status of your submitted paper or proposals, write to editorial@iospress.nl
如果您在出版方面需要帮助或有任何建, 件至: editorial@iospress.nl