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Issue title: Proceedings from the 17th International Symposium on Applied Electromagnetics and Mechanics (ISEM 2015)
Guest editors: Fumio Kojima, Futoshi Kobayashi and Hiroyuki Nakamoto
Article type: Research Article
Authors: Yamamoto, Takeshia; b; * | Matsuzawa, Shuheia | Ogawa, Shinnosukea | Ota, Tomohirob | Hirata, Katsuhiroa
Affiliations: [a] Graduate School of Engineering, Osaka University, Osaka, Japan | [b] Analysis Center, Panasonic Corporation, Kadoma City, Osaka, Japan
Correspondence: [*] Corresponding author: Takeshi Yamamoto, Graduate School of Engineering, Osaka University, 2-1 Yamadaoka Suita City, Osaka, Japan. E-mail:takeshi.yamamoto@ams.eng.osaka-u.ac.jp
Abstract: Electromagnetic fluid shows a unique behavior as elongation and sharpening in electrostatic field. Especially the electromagnetic fluid in this research can be largely deformed in microscale without breakup or collapsing thanks to its very high viscosity. The technique can be applied to microscale structures or MEMS devices. However experimental approach to control the deformation is insufficient because it is very difficult to measure electrostatic stress and surface tension acting on electrostatic fluid during deformation. This research reveals its mechanism quantitatively by calculating the deformation of electromagnetic fluid with a proposed combined method of FEM and MPS (Moving Particle Semi-implicit).
Keywords: Electromagnetic fluid, combined method, FEM, MPS
DOI: 10.3233/JAE-162226
Journal: International Journal of Applied Electromagnetics and Mechanics, vol. 52, no. 3-4, pp. 1519-1524, 2016
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