Searching for just a few words should be enough to get started. If you need to make more complex queries, use the tips below to guide you.
Issue title: Proceedings from the 17th International Symposium on Applied Electromagnetics and Mechanics (ISEM 2015)
Guest editors: Fumio Kojima, Futoshi Kobayashi and Hiroyuki Nakamoto
Article type: Research Article
Authors: Tang, Jianfei | Yan, Gang* | Cai, Chenning
Affiliations: [a] State Key Laboratory of Mechanics and Control of Mechanical Structures, Nanjing University of Aeronautics and Astronautics, Nanjing, Jiangsu, China | [b] College of Aerospace Engineering, Nanjing University of Aeronautics and Astronautics, Nanjing, Jiangsu, China
Correspondence: [*] Corresponding author: Gang Yan, State Key Laboratory of Mechanics and Control of Mechanical Structures, Nanjing University of Aeronautics and Astronautics, No. 29 Yudao Street, Nanjing 210016, Jiangsu, China. E-mail:yangang@nuaa.edu.cn
Abstract: This paper proposes a probabilistic approach to localize acoustic emission (AE) source in plate-like structures using particle filter (PF) with consideration of uncertainties from modeling error and measurement noise. The AE signals acquired by piezoelectric sensors are first processed by a complex wavelet transform to extract the time of arrival (TOA) information. Then localization of the AE source is formulated as a Bayesian state estimation problem with the source location and the wave velocity as unknown state parameters. A PF procedure is developed to iteratively estimate the unknown parameters simultaneously by using the TOA data. Experimental studies on a stiffened aluminum panel with AE events simulated by pensile lead breaks (PLBs) are conducted to demonstrate the effectiveness of the PF-based AE localization method.
Keywords: Acoustic emission, source localization, particle filter, uncertainty
DOI: 10.3233/JAE-162188
Journal: International Journal of Applied Electromagnetics and Mechanics, vol. 52, no. 3-4, pp. 975-981, 2016
IOS Press, Inc.
6751 Tepper Drive
Clifton, VA 20124
USA
Tel: +1 703 830 6300
Fax: +1 703 830 2300
sales@iospress.com
For editorial issues, like the status of your submitted paper or proposals, write to editorial@iospress.nl
IOS Press
Nieuwe Hemweg 6B
1013 BG Amsterdam
The Netherlands
Tel: +31 20 688 3355
Fax: +31 20 687 0091
info@iospress.nl
For editorial issues, permissions, book requests, submissions and proceedings, contact the Amsterdam office info@iospress.nl
Inspirees International (China Office)
Ciyunsi Beili 207(CapitaLand), Bld 1, 7-901
100025, Beijing
China
Free service line: 400 661 8717
Fax: +86 10 8446 7947
china@iospress.cn
For editorial issues, like the status of your submitted paper or proposals, write to editorial@iospress.nl
如果您在出版方面需要帮助或有任何建, 件至: editorial@iospress.nl